Submicron resolution 3D X-ray structural microscopy
نویسندگان
چکیده
منابع مشابه
Differential interference contrast x-ray microscopy with submicron resolution
Progress in lithography and nanofabrication @E. Di Fabrizio et al., Nature ~London! 401, 895 ~1999!# has made it possible to apply differential interference contrast ~DIC! in x-ray microscopy using an original x-ray doublet lens based on two specially developed zone plates. Switching from bright-field imaging ~absorption contrast! to x-ray DIC, we observe, similar to visible-light microscopy, a...
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ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations of Crystallography
سال: 2002
ISSN: 0108-7673
DOI: 10.1107/s0108767302086439